Bangkhunprom , Phranakorn Bangkok, Thailand

Semiconductor Real-time AMC Monitoring for the Process Floor

The Picarro SAM-S and SAM-C AMC Monitoring Systems integrate Picarro’s industry leading cavity ring-down spectroscopy (CRDS) analyzers into a high-performance sampling system. Traditional sampler designs degrade individual analyzer performance through the use of a linear manifold which limits the gas flow rate to each analyzer. As a result, traditional samplers relegate analyzer performance to the lowest common denominator. Time to detect an AMC is ultimately affected, which can lead to a false alarm or even missing an AMC event altogether. The superior design of the SAM system is optimized to ensure the highest combined performance, utilizing a patent-pending non-linear multiplexing system that enables high gas flow rates, minimizes cross port contamination, and quickly reports accurate contaminant concentrations. The Picarro SAM-S and SAM-C systems can be configured to sample multiple locations, accommodate multiple analyzers, and be paired with Picarro’s SI series of analyzers to measure a variety of contaminants. The Picarro SI Series analyzers offer the power of extreme sensitivity and accuracy for AMC, FOUP and fab equipment monitoring in a highly reliable, simple and compact design. These analyzers combine best-in-class performance, SEMI standards compliance, easy installation and very low cost of annual maintenance compared to any other AMC monitoring technique.